Real Field Data
Failures per Billion Hours (FIT)
Defects Parts per Million (DPPM)
In January 2019, Transphorm released the industry’s first complete validation data set for high voltage GaN power FETs.
That data set includes:
Device-specific qualification reports can be downloaded from our product pages.
Quality + Reliability Webinar
High voltage GaN transistors increase power density while reducing system size and cost. However, GaN FET validation differs from that of Silicon FETs.
Listen to Transphorm’s Q+R expert as he explains how GaN devices should be validated; the target baseline results for infant mortality, FIT rates, etc.; and how these metrics impact end systems.